Tobias N. Wassermann

According to our database, Tobias N. Wassermann authored at least 2 papers between 2023 and 2025.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2025

Reliability of a 3.3 kV SiC MOSFET .XT.

Tobias N. Wassermann, Florian Holley, Paul Salmen

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2023

SiC MOSFET threshold voltage stability during power cycling testing and the impact on the result interpretation.

Christian Schwabe, Xing Liu, Tobias N. Wassermann, Paul Salmen, Thomas Basler

Proceedings of the IEEE International Reliability Physics Symposium, 2023