Václav Papez

According to our database1, Václav Papez authored at least 16 papers between 2003 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2022
Transforming and evaluating the UK Biobank to the OMOP Common Data Model for COVID-19 research and beyond.
J. Am. Medical Informatics Assoc., 2022

2017
Applying an Archetype-Based Approach to Electroencephalography/Event-Related Potential Experiments in the EEGBase Resource.
Frontiers Neuroinformatics, 2017

Evaluating OpenEHR for Storing Computable Representations of Electronic Health Record Phenotyping Algorithms.
Proceedings of the 30th IEEE International Symposium on Computer-Based Medical Systems, 2017

Evaluation of Semantic Web Technologies for Storing Computable Definitions of Electronic Health Records Phenotyping Algorithms.
Proceedings of the AMIA 2017, 2017

2015
Archetypes Development in Electrophysiology Domain - Electroencephalography as a Personal EHR System Module.
Proceedings of the HEALTHINF 2015, 2015

2014
Influence of surface states on the reverse and noise properties of silicon power diodes.
IET Circuits Devices Syst., 2014

Software and hardware infrastructure for research in electrophysiology.
Frontiers Neuroinformatics, 2014

2013
Data and metadata models in electrophysiology domain: Separation of data models into semantic hierarchy and its integration into EEGBase.
Proceedings of the 2013 IEEE International Conference on Bioinformatics and Biomedicine, 2013

2012
Investigation of flicker noise in silicon diodes under reverse bias.
Microelectron. Reliab., 2012

Model of storage of ERP protocols in EEG/ERP portal.
Proceedings of the 5th International Conference on BioMedical Engineering and Informatics, 2012

2011
Software Infrastructure for EEG/ERP Research.
Proceedings of the KEOD 2011, 2011

Semantic Web Technologies in EEG/ERP Domain - Software Solution.
Proceedings of the HEALTHINF 2011, 2011

2008
Reliability of reverse properties of power semiconductor devices: : Influence of surface dielectric layer and its experimental verification.
Microelectron. J., 2008

2006
Conditions of temperature and time instability occurrence of reverse-biased semiconductor power devices.
Microelectron. J., 2006

OCVD carrier lifetime in P<sup>+</sup>NN<sup>+</sup> diode structures with axial carrier lifetime gradient.
Microelectron. J., 2006

2003
Transient effects on high voltage diode stack under reverse bias.
Microelectron. Reliab., 2003


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