W. Heo

According to our database, W. Heo authored at least 1 paper in 2012.

Collaborative distances:

• Dijkstra number of seven.
• Erdős number of five.

2012

Effect of additive N₂ and Ar gases on surface smoothening and fracture strength of Si wafers during high-speed chemical dry thinning.

W. Heo, Nae-Eung Lee

Microelectron. Reliab., 2012