Walter C. Riordan

According to our database1, Walter C. Riordan authored at least 1 paper in 2001.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of six.

Timeline

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Links

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Bibliography

2001
Unit level predicted yield: a method of identifying high defect density die at wafer sort.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001


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