Werner Muth

According to our database1, Werner Muth
  • authored at least 1 paper in 2004.
  • has a "Dijkstra number"2 of six.

Timeline

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Links

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Bibliography

2004
Bias temperature instability assessment of n- and p-channel MOS transistors using a polysilicon resistive heated scribe lane test structure.
Microelectronics Reliability, 2004


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