William H. McAnney

According to our database, William H. McAnney authored at least 14 papers between 1982 and 1992.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

1992

A Multiple Seed Linear Feedback Shift Register.

Jacob Savir, William H. McAnney

IEEE Trans. Computers, 1992

1991

Testing for Coupled Cells in Random-Access Memories.

Jacob Savir, William H. McAnney, Salvatore R. Vecchio

IEEE Trans. Computers, 1991

1988

Random Pattern Testability of Delay Faults.

Jacob Savir, William H. McAnney

IEEE Trans. Computers, 1988

Built-In Checking of the Correct Self-Test Signature.

William H. McAnney, Jacob Savir

IEEE Trans. Computers, 1988

Built-in test for RAMs.

Paul H. Bardell, William H. McAnney

IEEE Des. Test, 1988

Identification of Failing Tests with Cycling Registers.

Jacob Savir, William H. McAnney

Proceedings of the Proceedings International Test Conference 1988, 1988

1987

Fault Propagation Through Embedded Multiport Memories.

Jacob Savir, William H. McAnney, Salvatore R. Vecchio

IEEE Trans. Computers, 1987

1986

Pseudorandom Arrays for Built-In Tests.

Paul H. Bardell, William H. McAnney

IEEE Trans. Computers, 1986

1985

Random Pattern Testing for Address-Line Faults in an Embedded Multiport Memory.

Jacob Savir, William H. McAnney, Salvatore R. Vecchio

Proceedings of the Proceedings International Test Conference 1985, 1985

Random Pattern Testing for Data-Line Faults in an Embedded Multiport Memory.

Jacob Savir, William H. McAnney, Salvatore R. Vecchio

Proceedings of the Proceedings International Test Conference 1985, 1985

Self-Test of Random Access Memories.

Paul H. Bardell, William H. McAnney

Proceedings of the Proceedings International Test Conference 1985, 1985

1984

Random Testing for Stuck-At Storage Cells in an Embedded Memory.

William H. McAnney, Paul H. Bardell, V. P. Gupta

Proceedings of the Proceedings International Test Conference 1984, 1984

Parallel Pseudorandom Sequences for Built-In Test.

Paul H. Bardell, William H. McAnney

Proceedings of the Proceedings International Test Conference 1984, 1984

1982

Self-Testing of Multichip Logic Modules.

Paul H. Bardell, William H. McAnney

Proceedings of the Proceedings International Test Conference 1982, 1982