Woosol Han
Orcid: 0009-0001-2308-2294Timeline
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Bibliography
2025
Corrections to "Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications".
IEEE Trans. Instrum. Meas., 2025
Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications.
IEEE Trans. Instrum. Meas., 2025