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Xin Ju

Orcid: 0000-0003-2742-3719

Affiliations:
  • Nanyang Technological University, Singapore


According to our database1, Xin Ju authored at least 3 papers between 2019 and 2020.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of six.

Timeline

Legend:

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Links

Online presence:

On csauthors.net:

Bibliography

2020
Alteration of Gate-Oxide Trap Capture/Emission Time Constants by Channel Hot-Carrier Effect in the Metal-Oxide-Semiconductor Field-Effect Transistor.
[BibTeX]
[DOI]
Xin Ju
,
Diing Shenp Ang
IEEE Access, 2020

Gate-Oxide Trapping Enabled Synaptic Logic Transistor.
[BibTeX]
[DOI]
Xin Ju
,
Diing Shenp Ang
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019
Response of Switching Hole Traps in the Small-Area P-MOSFET Under Channel Hot-Hole Effect.
[BibTeX]
[DOI]
Xin Ju
,
Diing Shenp Ang
Proceedings of the IEEE International Reliability Physics Symposium, 2019


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