Xinnan Zheng
Orcid: 0000-0002-4229-4188
According to our database1,
Xinnan Zheng
authored at least 12 papers
between 2023 and 2025.
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Bibliography
2025
Fast Real-Time Electromagnetic Tomography System for Size Prediction and Material and Position Classification.
IEEE Trans. Instrum. Meas., 2025
Fast inversion of parameters on Jiles-Atherton hysteresis model based on physics-guided deep learning network.
Eng. Appl. Artif. Intell., 2025
ECTAR: An Integrated Augmented Reality and Eddy Current Array System for Non-destructive Testing of Metallic Plate.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2025
Exploring the Effect of Probe Size and Lift-Off on Footprint in Pulsed Eddy Current Testing.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2025
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2025
Analytical Modeling of Eddy Current Testing for Asymmetric Cylinders and Estimation of Radii and Electromagnetic Properties.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2025
2024
Thickness Measurement and Surface-Defect Detection for Metal Plate Using Pulsed Eddy Current Testing and Optimized Res2Net Network.
IEEE Trans. Instrum. Meas., 2024
Simultaneous measurements of metal thickness and defect depth using low frequency sweeping eddy current testing.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2024
2023
Through Thickness Inspection of Layered Magnetic Material Using Pulsed Eddy-Current Testing.
IEEE Trans. Instrum. Meas., 2023
Inspection of Defects Depth for Stainless-Steel Sheets Using Four-Coil Excitation Sensor and Deep Learning.
IEEE Trans. Instrum. Meas., 2023
Inspection of Defects Depth for Stainless-Steel Sheets Using 4-coil Excitation Sensor with 1D CNN.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2023
Real-time Automatic Thickness Recognition Using Pulse Eddy Current with Deep Learning.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2023