Y. Shneider

According to our database1, Y. Shneider
  • authored at least 1 paper in 2017.
  • has a "Dijkstra number"2 of six.

Timeline

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Links

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Bibliography

2017
Peculiarities of hole trapping in Al2O3-SiO2 gate dielectric stack.
Microelectronics Reliability, 2017


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