Y. T. Yeow

According to our database, Y. T. Yeow authored at least 1 paper in 2001.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2001

Analysis of the gate capacitance measurement technique and its application for the evaluation of hot-carrier degradation in submicrometer MOSFETs.

C. T. Hsu, M. M. Lau, Y. T. Yeow

Microelectron. Reliab., 2001