Y. Y. Hsieh

According to our database1, Y. Y. Hsieh authored at least 1 paper in 2007.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of six.

Timeline

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Links

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Bibliography

2007
Effect of oval defects in GaAs on the reliability of SiN<sub>x</sub> metal-insulator-metal capacitors.
Microelectron. Reliab., 2007


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