Yanzhou Mu

Orcid: 0000-0003-1816-2246

According to our database1, Yanzhou Mu authored at least 9 papers between 2019 and 2022.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2022
Can test input selection methods for deep neural network guarantee test diversity? A large-scale empirical study.
Inf. Softw. Technol., 2022

Deep Learning Test Optimization Method Using Multi-objective Optimization.
Int. J. Softw. Informatics, 2022

2021
Revisiting heterogeneous defect prediction methods: How far are we?
Inf. Softw. Technol., 2021

HARS: Heuristic-Enhanced Adaptive Randomized Scheduling for Concurrency Testing.
Proceedings of the 21st IEEE International Conference on Software Quality, 2021

2020
Do different cross-project defect prediction methods identify the same defective modules?
J. Softw. Evol. Process., 2020

ALTRA: Cross-Project Software Defect Prediction via Active Learning and Tradaboost.
IEEE Access, 2020

2019
Revisiting Heterogeneous Defect Prediction: How Far Are We?
CoRR, 2019

DeepCPDP: Deep Learning Based Cross-Project Defect Prediction.
IEEE Access, 2019

Cross-project Defect Prediction via ASTToken2Vec and BLSTM-based Neural Network.
Proceedings of the International Joint Conference on Neural Networks, 2019


  Loading...