Yasutoshi Umehara

According to our database, Yasutoshi Umehara authored at least 3 papers between 1996 and 2019.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2019

Nondestructive Inline Inspection of Through-Silicon Vias Based on X-Ray Imaging and its Uncertainty Budget.

Yasutoshi Umehara, Nobuyuki Moronuki

Int. J. Autom. Technol., 2019

1997

Novel Optical Probing System for Quarter-micron VLSI Circuits.

Kazuyuki Ozaki, Hidenori Sekiguchi, Shinichi Wakana, Yoshiro Goto, Yasutoshi Umehara, Jun Matsumoto

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

1996

Novel Optical Probing System with Submicron Spatial Resolution for Internal Diagnosis of VLSI Circuits.

Kazuyuki Ozaki, Hidenori Sekiguchi, Shinichi Wakana, Yoshiro Goto, Yasutoshi Umehara, Jun Matsumoto

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996