Yi Deng
Orcid: 0000-0003-2657-4689Affiliations:
- Beihang University, School of Reliability and Systems Engineering, Beijing, China
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Bibliography
2020
A Combined Method for Analog Circuit Fault Diagnosis Based on Dependence Matrices and Intelligent Classifiers.
IEEE Trans. Instrum. Meas., 2020
Analog circuit fault diagnosis based on density peaks clustering and dynamic weight probabilistic neural network.
Neurocomputing, 2020
An adaptive new state recognition method based on density peak clustering and voting probabilistic neural network.
Appl. Soft Comput., 2020