Yi-Shian Dong

Orcid: 0009-0000-6040-4777

According to our database¹, Yi-Shian Dong authored at least 3 papers between 2023 and 2025.

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Timeline

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2025

Importance Inference of Optimal Test Planning for Degradation Analysis.

[DOI]

IEEE Trans. Reliab., September, 2025

2024

A Complete Bayesian Degradation Analysis Based on Inverse Gaussian Processes.

[DOI]

IEEE Trans. Reliab., March, 2024

2023

The first-passage-time moments for the Hougaard process and its Birnbaum-Saunders approximation.

[DOI]

Stat. Comput., June, 2023