Yider Wu

According to our database1, Yider Wu authored at least 1 paper in 2004.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

On csauthors.net:

Bibliography

2004
Breakdown and reliability of p-MOS devices with stacked RPECVD oxide/nitride gate dielectric under constant voltage stress.
Microelectron. Reliab., 2004


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