Yider Wu

According to our database, Yider Wu authored at least 1 paper in 2004.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2004

Breakdown and reliability of p-MOS devices with stacked RPECVD oxide/nitride gate dielectric under constant voltage stress.

Yi-Mu Lee, Yider Wu, Gerald Lucovsky

Microelectron. Reliab., 2004