Yohei Miyaki
Orcid: 0009-0005-5154-0538
According to our database1,
Yohei Miyaki
authored at least 2 papers
between 2024 and 2025.
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Bibliography
2025
Re-Consideration of Correlation Between Interface States and Bulk Traps Using Cryogenic Measurement.
Proceedings of the 30th Asia and South Pacific Design Automation Conference, 2025
2024
Re-consideration of Correlation between Interface and Bulk Trap Generations using Cryogenic Measurement.
Proceedings of the IEEE International Reliability Physics Symposium, 2024