Yoon Huh
Orcid: 0009-0008-6126-2270
According to our database1,
Yoon Huh
authored at least 2 papers
between 2005 and 2025.
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Bibliography
2025
Universal Joint Source-Channel Coding for Modulation-Agnostic Semantic Communication.
IEEE J. Sel. Areas Commun., July, 2025
2005
ESD-Induced Internal Core Device Failure: New Failure Modes in System-on-Chip (SoC) Designs, invited.
Proceedings of the 5th IEEE International Workshop on System-on-Chip for Real-Time Applications (IWSOC 2005), 2005