Yoshikazu Nagamura

According to our database, Yoshikazu Nagamura authored at least 3 papers between 2021 and 2025.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2025

Mixed-Defect Wafer Map Classification Using CapsNet-Based Models With Precise Scratch-Pattern Reconstruction.

Yoshikazu Nagamura, Yuki Yamanaka, Itsuki Fujita, Masayuki Arai, Satoshi Fukumoto

IEEE Access, 2025

2023

Toward Improvement and Evaluation of Reconstruction Capability of CapsNet-Based Wafer Map Defect Pattern Classifier.

Yuki Yamanaka, Masayuki Arai, Yoshikazu Nagamura, Satoshi Fukumoto

Proceedings of the IEEE International Test Conference in Asia, 2023

2021

Note on CapsNet-Based Wafer Map Defect Pattern Classification.

Itsuki Fujita, Yoshikazu Nagamura, Masayuki Arai, Satoshi Fukumoto

Proceedings of the 30th IEEE Asian Test Symposium, 2021