Ziren Zhu

According to our database, Ziren Zhu authored at least 2 papers between 2023 and 2026.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2026

ResNeSt Wafer Map Defect Pattern Recognition Based on the Multi-attention Mechanism and Enhanced Activation Function.

Shouhong Chen, Lingfeng Han, Cong Wei, Ziren Zhu, Xingna Hou, Ling Guo

J. Electron. Test., April, 2026

2023

Wafer map defect pattern detection method based on improved attention mechanism.

Shouhong Chen, Meiqi Liu, Xingna Hou, Ziren Zhu, Zhentao Huang, Tao Wang

Expert Syst. Appl., November, 2023