Abhishek Das
Orcid: 0000-0002-2362-0195Affiliations:
- University of Texas at Austin, Austin, TX, USA
According to our database1,
Abhishek Das authored at least 12 papers
between 2017 and 2025.
Collaborative distances:
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Bibliography
2025
Double Column Error Correction in RRAM Matrix Multiplication Using Weighted Checksums.
Proceedings of the 26th IEEE Latin American Test Symposium, 2025
2024
Double Adjacent Error Correction in RRAM Matrix Multiplication using Weighted Checksums.
Proceedings of the 30th IEEE International Symposium on On-Line Testing and Robust System Design, 2024
2023
Highly Efficient Layered Syndrome-based Double Error Correction Utilizing Current Summing in RRAM Cells to Simplify Decoder.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023
2020
IEEE Trans. Computers, 2020
Proceedings of the 38th IEEE VLSI Test Symposium, 2020
2019
Layered-ECC: A Class of Double Error Correcting Codes for High Density Memory Systems.
Proceedings of the 37th IEEE VLSI Test Symposium, 2019
Proceedings of the 37th IEEE VLSI Test Symposium, 2019
Online Correction of Hard Errors and Soft Errors via One-Step Decodable OLS Codes for Emerging Last Level Caches.
Proceedings of the IEEE Latin American Test Symposium, 2019
2018
Systematic b-adjacent symbol error correcting reed-solomon codes with parallel decoding.
Proceedings of the 36th IEEE VLSI Test Symposium, 2018
Proceedings of the 2018 on Great Lakes Symposium on VLSI, 2018
Proceedings of the 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2018
2017
Limited Magnitude Error Correction Using OLS Codes for Memories with Multilevel Cells.
Proceedings of the 2017 IEEE International Conference on Computer Design, 2017