Alan Y. Otero-Carrascal
Orcid: 0000-0002-4341-7370
According to our database1,
Alan Y. Otero-Carrascal
authored at least 3 papers
between 2023 and 2025.
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Bibliography
2025
Off-State TDDB Degradation of RC-Features and Threshold Voltage on Advanced FinFETs from RF Measurements for 5G Applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
2024
Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI MOSFETs using an RF Measurement Technique.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2023
Impact of Non-Conducting HCI Degradation on Small-Signal Parameters in RF SOI MOSFET.
Proceedings of the IEEE International Reliability Physics Symposium, 2023