Alessandro Marras

According to our database, Alessandro Marras authored at least 5 papers between 2005 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2019

P2M: A 2MPixel CMOS Image Sensor for Soft X-Ray Detection.

Iain Sedgwick, F. Krivan, I. Shevyakov, Manfred Zimmer, Heinz Graafsma, G. Cautero, D. Giuressi, R. Menk, G. Pinaroli, Luigi Stebel, A. Greer, Nicola Carlo Guerrini, U. Pedersen, N. Tartoni, S. Y. Rah, H. J. Hyun, K. S. Kim, S. H. Kim, B. Boitrelle, F. Orsini, B. Marsh, T. Nicholls, Alessandro Marras, C. B. Wunderer, J. Correa, Sabine Lange, M. Kuhn

Proceedings of the 26th IEEE International Conference on Electronics, Circuits and Systems, 2019

2014

Vertically integrated circuits: Example of an application to an x-ray detector.

Alessandro Marras, Aschkan Allahgholi, Julian Becker, L. Bianco, Annette Delfs, Peter Goettlicher, Alexander Klyuev, S. Jack, Sabine Lange, Igor Sheviakov, Ulrich Trunk, Qingqing Xia, Jiaguo Zhang, Manfred Zimmer, Roberto Dinapoli, Dominic Greiffenberg, Davide Mezza, Aldo Mozzanica, Bernd Schmitt, Xintian Shi, Robert Klanner, Joern Schwandt, Heinz Graafsma

Proceedings of the 21st IEEE International Conference on Electronics, Circuits and Systems, 2014

2012

A low noise high dynamic range analog front-end ASIC for the AGIPD XFEL detector.

Xintian Shi, Roberto Dinapoli, Dominic Greiffenberg, Beat Henrich, Aldo Mozzanica, Bernd Schmitt, Hans Krüger, Heinz Graafsma, Alexander Klyuev, Alessandro Marras, Ulrich Trunk

Proceedings of the 19th IEEE International Conference on Electronics, Circuits and Systems, 2012

2007

Reliability assessment of multi-via Cu-damascene structures by wafer-level isothermal electromigration tests.

Alessandro Marras, Maurizio Impronta, Ilaria De Munari, M. G. Valentini, Andrea Scorzoni

Microelectron. Reliab., 2007

2005

Impact of gate-leakage currents on CMOS circuit performance.

Alessandro Marras, Ilaria De Munari, Davide Vescovi, Paolo Ciampolini

Microelectron. Reliab., 2005