Alex Juan

According to our database1, Alex Juan authored at least 1 paper in 2020.

Collaborative distances:
  • Dijkstra number2 of seven.
  • Erdős number3 of six.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2020
Stress Induced Voiding Behavior of Electroplated Copper Thin Films in Highly Scaled Cu/low-k interconnects.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020


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