Alex Vayshenker

According to our database1, Alex Vayshenker authored at least 2 papers between 2002 and 2003.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
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Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2003
Critical reliability challenges in scaling SiO<sub>2</sub>-based dielectric to its limit.
Microelectron. Reliab., 2003

2002
CMOS scaling beyond the 100-nm node with silicon-dioxide-based gate dielectrics.
IBM J. Res. Dev., 2002


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