Wing L. Lai

According to our database, Wing L. Lai authored at least 4 papers between 2002 and 2003.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2003

Critical reliability challenges in scaling SiO₂-based dielectric to its limit.

Ernest Y. Wu, Jordi Suñé, Wing L. Lai, Alex Vayshenker, Edward J. Nowak, David L. Harmon

Microelectron. Reliab., 2003

Statistics of soft and hard breakdown in thin SiO₂ gate oxides.

Jordi Suñé, Ernest Y. Wu, David Jiménez, Wing L. Lai

Microelectron. Reliab., 2003

2002

A new empirical extrapolation method for time-dependent dielectric breakdown reliability projections of thin SiO₂ and nitride-oxide dielectrics.

Fen Chen, Rolf-Peter Vollertsen, Baozhen Li, Dave Harmon, Wing L. Lai

Microelectron. Reliab., 2002

CMOS scaling beyond the 100-nm node with silicon-dioxide-based gate dielectrics.

Ernest Y. Wu, Edward J. Nowak, Alex Vayshenker, Wing L. Lai, David L. Harmon

IBM J. Res. Dev., 2002