Asad Amin Bawa

According to our database1, Asad Amin Bawa authored at least 7 papers between 2009 and 2015.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2015
Improving X-tolerant combinational output compaction via input rotation.
Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015

2014
Reducing Cost of Yield Enhancement in 3-D Stacked Memories Via Asymmetric Layer Repair Capability.
IEEE Trans. Very Large Scale Integr. Syst., 2014

2013
Efficient compression of x-masking control data via dynamic channel allocation.
Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

2012
Using asymmetric layer repair capability to reduce the cost of yield enhancement in 3D stacked memories.
Proceedings of the 20th IEEE/IFIP International Conference on VLSI and System-on-Chip, 2012

Implementing defect tolerance in 3D-ICs by exploiting degrees of freedom in assembly.
Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012

Using partial masking in X-chains to increase output compaction for an X-canceling MISR.
Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012

2009
Improving Memory Repair by Selective Row Partitioning.
Proceedings of the 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009


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