We stand with Ukraine  

Baojun Liu

Orcid: 0000-0001-8658-2950

Affiliations:
  • Air Force Engineering University, Xinyang, Henan, China


According to our database1, Baojun Liu authored at least 5 papers between 2020 and 2024.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of six.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

Online presence:

On csauthors.net:

Bibliography

2024
An Analytical Model for Deposited Charge of Single Event Transient (SET) in FinFET.
[BibTeX]
[DOI]
Baojun Liu
,
Li Cai
,
Chuang Li
J. Electron. Test., April, 2024

Variations of single event transient induced by line edge roughness (LER) and temperature in FinFET.
[BibTeX]
[DOI]
Baojun Liu
,
Xiaokuo Yang
,
Jing Zhu
Microelectron. J., February, 2024

2022
Model and analysis of single event transient sensitivity based on uncertainty quantification.
[BibTeX]
[DOI]
Baojun Liu
,
Li Cai
Microprocess. Microsystems, April, 2022

2021
Effect of temperature and single event transient on crosstalk in coupled single-walled carbon nanotube (SWCNT) bundle interconnects.
[BibTeX]
[DOI]
Baojun Liu
,
Cheng Li
,
Chuang Li
,
Shuang Zhang
Int. J. Circuit Theory Appl., 2021

2020
An Analytic Model for Predicting Single Event (SE) Crosstalk of Nanometer CMOS Circuits.
[BibTeX]
[DOI]
Baojun Liu
,
Li Cai
,
Xiaoqiang Liu
J. Electron. Test., 2020


  Loading...