Bart Hovens

According to our database, Bart Hovens authored at least 2 papers between 2011 and 2013.

Collaborative distances:

• Dijkstra number of seven.
• Erdős number of six.

2013

Characterization and modeling of depletion-type nMOS transistors for RF switches with zero power consumption in ON-state.

Cristian Andrei, Denis Raoulx, Guy Imbert, Bart Hovens, Andrea Scarpa

Proceedings of 2013 International Conference on IC Design & Technology, 2013

2011

Reliability assessment on new reprogrammable non-volatile memory devices based on SiCr-O.

Yuan Li, Romain Delangle, Xiao-mei Zhang, Bart Hovens

Microelectron. Reliab., 2011