Benoit Dubois

Orcid: 0000-0003-1462-2161

According to our database1, Benoit Dubois authored at least 3 papers between 2007 and 2023.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2023
Reliability and Reproducibility of the Cryogenic Sapphire Oscillator Technology.
IEEE Trans. Instrum. Meas., 2023

2009
Modelling of hot-carrier degradation and its application for analog design for reliability.
Microelectron. J., 2009

2007
Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability.
Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007


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