Bijaya Kumar Hatuwal

According to our database, Bijaya Kumar Hatuwal authored at least 4 papers between 2020 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

The Second Visual Object Tracking Segmentation VOTS2024 Challenge Results.

Matej Kristan, Jirí Matas, Pavel Tokmakov, Michael Felsberg, Luka Cehovin Zajc, Alan Lukezic, Khanh-Tung Tran, Xuan-Son Vu, Johanna Björklund, Hyung Jin Chang, Gustavo Fernández, Minasadat Attari, Antoni B. Chan, Liang Chen, Xin Chen, Jaired Collins, Yutao Cui, Ganesh Sai Manas Devarapu, Yinglong Du, Heng Fan, Wan-Cyuan Fan, Zhenhua Feng, Mingqi Gao, Rama Krishna Gorthi, Raghav Goyal, Jungong Han, Bijaya Kumar Hatuwal, Zhenyu He, Xiantao Hu, Xingsen Huang, Yuqing Huang, Dongmei Jiang, Ben Kang, Kannappan Palaniappan, Josef Kittler, Simiao Lai, Ning Li, Xiaohai Li, Xin Li, Cheng Liang, Liting Lin, Haibin Ling, Ting Liu, Ziquan Liu, Huchuan Lu, Yifei Luo, Deshui Miao, Juan Mogollon, Ziqi Pang, Jaswanth Reddy Pochimireddy, Viktor Prutyanov, Gani Rahmon, Aleksandr Romanov, Liangtao Shi, Mennatullah Siam, Leonid Sigal, Arun Kumar Sivapuram, Roman A. Solovyev, Elham Soltani Kazemi, Imad Eddine Toubal, Jia Wan, Limin Wang, Xinying Wang, Yaowei Wang, Yu-Xiong Wang, Zhiquan Wang, Gangshan Wu, Qiangqiang Wu, Xiaojun Wu, Zihao Xia, Jinxia Xie, Chenlong Xu, Tianyang Xu, Yong Xu, Chaocan Xue, Chao Yang, Jinyu Yang, Ming-Hsuan Yang, Chenyang Yu, Ke Yu, Chunhui Zhang, Jiaming Zhang, Zhipeng Zhang, Feng Zheng, Yaozong Zheng, Bineng Zhong, Jinglin Zhou, Junbao Zhou, Yong Zhou, Zikun Zhou, Guibo Zhu, Jiawen Zhu, Xuefeng Zhu, Vladimir V. Zunin

Proceedings of the Computer Vision - ECCV 2024 Workshops, 2024

2023

Fine-Tuning YOLOv5 with Genetic Algorithm For Helmet Violation Detection.

Elham Soltanikazemi, Armstrong Aboah, Elizabeth Arthur, Bijaya Kumar Hatuwal

CoRR, 2023

Real-Time Helmet Violation Detection in AI City Challenge 2023 with Genetic Algorithm-Enhanced YOLOv5.

Elham Soltanikazemi, Ashwin Dhakal, Bijaya Kumar Hatuwal, Imad Eddine Toubal, Armstrong Aboah, Kannappan Palaniappan

Proceedings of the 52nd IEEE Applied Imagery Pattern Recognition Workshop, 2023

2020

Plant Leaf Disease Recognition Using Random Forest, KNN, SVM and CNN.

Bijaya Kumar Hatuwal, Aman Shakya, Basanta Joshi

Polibits, 2020