Binghai Liu

According to our database, Binghai Liu authored at least 4 papers between 2015 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

Cross-sectional nanoprobing sample preparation on sub-micron device with fast laser grooving technique.

Pik Kee Tan, Yuzhe Zhao, Francis Rivai, Binghai Liu, Yanlin Pan, Ran He, Hao Tan, Zhihong Mai

Microelectron. Reliab., 2018

Failure analysis on 14 nm FinFET devices with ESD CDM failure.

Shaalini Chithambaram, Pik Kee Tan, Yuzhe Zhao, Binghai Liu, Yinzhe Ma, Alfred Quah, Dayanand Nagalingam, Yanlin Pan, Zhihong Mai

Microelectron. Reliab., 2018

2016

Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system.

Yuzhe Zhao, Q. J. Wang, Pik Kee Tan, Huei Hao Yap, Binghai Liu, H. Feng, Hao Tan, Ran He, Y. M. Huang, D. D. Wang, Lei Zhu, C. Q. Chen, Francis Rivai, Jeffrey Lam, Zhihong Mai

Microelectron. Reliab., 2016

2015

Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique.

Huei Hao Yap, Pik Kee Tan, G. R. Low, M. K. Dawood, Hua Feng, Yuzhe Zhao, Ran He, Hao Tan, J. Zhu, Binghai Liu, Y. M. Huang, D. D. Wang, Jeffrey Lam, Zhihong Mai

Microelectron. Reliab., 2015