Bonnie E. Weir

According to our database, Bonnie E. Weir authored at least 2 papers between 2005 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2019

Utilizing a Thorough Understanding of Critical Aging and Failure Mechanisms in finFET Technologies to Enable Reliable High Performance Circuits.

Bonnie E. Weir, Vani Prasad, Shahriar Moinian, SangJune Park, Joseph Blasko, Jason Brown, Jayanthi Pallinti

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2005

Gate dielectric breakdown in the time-scale of ESD events.

Bonnie E. Weir, Che-Choi Leung, Paul J. Silverman, Muhammad Ashraful Alam

Microelectron. Reliab., 2005