Bozhan Cao
Orcid: 0009-0004-4967-5647Timeline
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Bibliography
2025
Semisupervised Domain Adaptation for Wafer Map Defect Recognition via Cross-Alignment Network.
IEEE Trans. Instrum. Meas., 2025
SF-Net: A Force-Based, Formula-Enhanced Residual Bi-LSTM for Snap-Fit State Classification.
Proceedings of the IEEE International Conference on Robotics and Biomimetics, 2025
Event-Based Optical Tactile Sensor and Sparse Transformer for Robust Snap-Fit Recognition.
Proceedings of the IEEE International Conference on Robotics and Biomimetics, 2025