Bruce M. Paine

According to our database, Bruce M. Paine authored at least 6 papers between 2001 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2015

Scaling DC lifetests on GaN HEMT to RF conditions.

Bruce M. Paine

Microelectron. Reliab., 2015

Degradation rate for surface pitting in GaN HEMT.

Bruce M. Paine, Vincent T. Ng, Steve R. Polmanter, Neil T. Kubota, Carl R. Ignacio

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2004

High-resolution transmission electron microscopy on aged InP HBTs.

Bruce M. Paine, Timothy J. Perham, Stephen Thomas III

Microelectron. Reliab., 2004

2003

Reliability of 100 nm silicon nitride capacitors in an InP HEMT MMIC process.

William J. Rowe, Bruce M. Paine, Adele E. Schmitz, Robert H. Walden, Michael J. Delaney

Microelectron. Reliab., 2003

The effects of ternary alloys on thermal resistances of HBTs, HEMTs, and laser diodes.

Bruce M. Paine, Ami P. Shah, Thomas Rust

Microelectron. Reliab., 2003

2001

Ka-band InP high electron mobility transistor monolithic microwave integrated circuit reliability.

Bruce M. Paine, Richard C. Wong, Adele E. Schmitz, Robert H. Walden, Loi D. Nguyen, Michael J. Delaney, Kenny C. Hum

Microelectron. Reliab., 2001