Burnell G. West

According to our database, Burnell G. West authored at least 12 papers between 1983 and 2004.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2004

Digital Synchronization for Reconfigurable ATE.

Burnell G. West, Michael F. Jones

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Open Architecture ATE: Prospects and Problems.

Burnell G. West

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Multi-GB/s IC Test Challenges and Solutions.

Burnell G. West

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Simultaneous Bidirectional Test Data Flow for a Low-cost Wafer Test Strategy.

Burnell G. West

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Open ATE Architecture: Key Challenges.

Burnell G. West

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Rapid-response temperature control provides new defect screening opportunities.

Mark Malinoski, Burnell G. West

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

The path to one-picosecond accuracy.

Luca Sartori, Burnell G. West

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

At-speed structural test.

Burnell G. West

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

Accuracy requirements in at-speed functional test.

Burnell G. West

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Functional ATE can meet the challenges.

Burnell G. West

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1994

500-MHz Testing on a 100-MHz Tester.

Didier Wimmers, Kris Sakaitani, Burnell G. West

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1983

Attainable Accuracy of Autocalibrating VLSI Test Systems.

Burnell G. West

Proceedings of the Proceedings International Test Conference 1983, 1983