Byungchoul Park
Orcid: 0000-0002-5905-0964
According to our database1,
Byungchoul Park
authored at least 15 papers
between 2017 and 2025.
Collaborative distances:
Collaborative distances:
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2025
A Practical Layout Solution for Suppressing MIM Capacitor Coupling Noise in Column-Parallel CIS Design.
IEEE Access, 2025
A Fully Digital Indirect Time-of-Flight Image Sensor With Multi-Frame Integration and Time-Gated Single-Photon Counting Method.
IEEE Access, 2025
IEEE Access, 2025
IEEE Access, 2025
SPAD Flash LiDAR with Chopped Analog Counter for 76m Range and 120klx Background Light.
Proceedings of the IEEE International Solid-State Circuits Conference, 2025
2024
A Highly Digital 143.2-dB DR Sub-1° Phase Error Impedance Monitoring IC With Pulsewidth Modulation Frontend.
IEEE J. Solid State Circuits, April, 2024
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024
A 30fps 64×64 CMOS Flash LiDAR Sensor with Push-Pull Analog Counter Achieving 0.1% Depth Uncertainty at 70m Detection Range.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024
2023
A 113.3-dB Dynamic Range 600 Frames/s SPAD X-Ray Detector With Seamless Global Shutter and Time-Encoded Extrapolation Counter.
IEEE J. Solid State Circuits, November, 2023
A 400 × 200 600fps 117.7dB-DR SPAD X-Ray Detector with Seamless Global Shutter and Time-Encoded Extrapolation Counter.
Proceedings of the IEEE International Solid- State Circuits Conference, 2023
2021
A 64 × 64 SPAD-Based Indirect Time-of-Flight Image Sensor With 2-Tap Analog Pulse Counters.
IEEE J. Solid State Circuits, 2021
2020
IEEE J. Solid State Circuits, 2020
2019
A 64×64 APD-Based ToF Image Sensor with Background Light Suppression up to 200 klx Using In-Pixel Auto-Zeroing and Chopping.
Proceedings of the 2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019, 2019
Proceedings of the 2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019, 2019
2017
Microelectron. Reliab., 2017