Ilgu Yun
Orcid: 0000-0003-1272-6768
According to our database1,
Ilgu Yun
authored at least 29 papers
between 2004 and 2022.
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Bibliography
2022
Self-heating effect of GAAFET and FinFET for over 2-V applications using TCAD simulation.
Proceedings of the International Conference on Electronics, Information, and Communication, 2022
2018
Compact Drain Current Model of Nanoscale FinFET Considering Short Channel Effect in Ballistic Transport Regime.
Proceedings of the 15th International Conference on Synthesis, 2018
Modeling and Simulation of Novel GaN-based Light Emitting Transistor for Display Applications.
Proceedings of the 14th Conference on Ph.D. Research in Microelectronics and Electronics, 2018
2017
Microelectron. Reliab., 2017
Mechanical stress-induced degradation model of amorphous InGaZnO thin film transistors by strain-initiated defect generation.
Microelectron. Reliab., 2017
Effect of selectively passivated layer on foldable low temperature polycrystalline silicon thin film transistor characteristics under dynamic mechanical stress.
Microelectron. Reliab., 2017
2016
Plasma Process Uniformity Diagnosis Technique Using Optical Emission Spectroscopy With Spatially Resolved Ring Lens.
IEEE Trans. Ind. Electron., 2016
Instability of oxide thin film transistor under electrical-mechanical hybrid stress for foldable display.
Microelectron. Reliab., 2016
Crack-guided effect on dynamic mechanical stress for foldable low temperature polycrystalline silicon thin film transistors.
Microelectron. Reliab., 2016
2015
Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics.
Microelectron. Reliab., 2015
Reliability modeling and analysis of flicker noise for pore structure in amorphous chalcogenide-based phase-change memory devices.
Microelectron. Reliab., 2015
Microelectron. Reliab., 2015
2014
Conduction instability of amorphous InGaZnO thin-film transistors under constant drain current stress.
Microelectron. Reliab., 2014
2013
Methodology for improvement of data retention in floating gate flash memory using leakage current estimation.
Microelectron. Reliab., 2013
2012
Threshold voltage shift prediction for gate bias stress on amorphous InGaZnO thin film transistors.
Microelectron. Reliab., 2012
Experimental observation of gate geometry dependent characteristic degradations of the multi-finger MOSFETs.
Microelectron. Reliab., 2012
Modeling and optimization of ITO/Al/ITO multilayer films characteristics using neural network and genetic algorithm.
Expert Syst. Appl., 2012
2011
Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors.
Microelectron. Reliab., 2011
Process estimation and optimized recipes of ZnO: Ga thin film characteristics for transparent electrode applications.
Expert Syst. Appl., 2011
2009
Reliability assessment of 1.55-µm vertical cavity surface emitting lasers with tunnel junction using high-temperature aging tests.
Microelectron. Reliab., 2009
Modeling and optimization of the growth rate for ZnO thin films using neural networks and genetic algorithms.
Expert Syst. Appl., 2009
2008
Neural network modeling of the cellgap process for liquid crystal display fabricated on plastic substrates.
Expert Syst. Appl., 2008
2007
Degradation analysis in asymmetric sampled grating distributed feedback laser diodes.
Microelectron. J., 2007
Neural network based modeling of HfO<sub>2</sub> thin film characteristics using Latin Hypercube Sampling.
Expert Syst. Appl., 2007
Effect of the principal component on the PCA-based neural network model for HFO2 thin film characteristics.
Proceedings of the IASTED International Conference on Artificial Intelligence and Applications, 2007
2006
Modeling growth rate of HfO<sub>2</sub> thin films grown by metal-organic molecular beam epitaxy.
Microelectron. J., 2006
PCA-Based Neural Network Modeling Using the Photoluminescence Data for Growth Rate of ZnO Thin Films Fabricated by Pulsed Laser Deposition.
Proceedings of the Advances in Neural Networks - ISNN 2006, Third International Symposium on Neural Networks, Chengdu, China, May 28, 2006
2004
Investigation of manufacturing variations of planar InP/InGaAs avalanche photodiodes for optical receivers.
Microelectron. J., 2004
An In-Order SMT Architecture with Static Resource Partitioning for Consumer Applications.
Proceedings of the Parallel and Distributed Computing: Applications and Technologies, 2004