Chieh-Ming Lai

According to our database, Chieh-Ming Lai authored at least 2 papers between 2007 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2010

Improvement of TDDB reliability, characteristics of HfO₂ high-k/metal gate MOSFET device with oxygen post deposition annealing.

Chia-Wei Hsu, Yean-Kuen Fang, Wen-Kuan Yeh, Chun-Yu Chen, Yen-Ting Chiang, Feng-Renn Juang, Chien-Ting Lin, Chieh-Ming Lai

Microelectron. Reliab., 2010

2007

The impacts of high tensile stress CESL and geometry design on device performance and reliability for 90 nm SOI nMOSFETs.

Chieh-Ming Lai, Yean-Kuen Fang, Chien-Ting Lin, Chia-Wei Hsu, Wen-Kuan Yeh

Microelectron. Reliab., 2007