Christian Bayer

Orcid: 0000-0003-3995-8892

Affiliations:
  • Fraunhofer Institute for Integrated Circuits, Dresden, Germany


According to our database1, Christian Bayer authored at least 3 papers between 2012 and 2016.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

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Links

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Bibliography

2016
A generic approach for detection of wear-out situations in machine subsystems.
Proceedings of the 21st IEEE International Conference on Emerging Technologies and Factory Automation, 2016

2013
Sensorless drive diagnosis using automated feature extraction, significance ranking and reduction.
Proceedings of 2013 IEEE 18th Conference on Emerging Technologies & Factory Automation, 2013

2012
System level simulation - A core method for efficient design of MEMS and mechatronic systems.
Proceedings of the International Multi-Conference on Systems, Signals & Devices, 2012


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