Christian Burmer

According to our database, Christian Burmer authored at least 5 papers between 2006 and 2010.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2010

Ultra-fast CAD scan chain highlighting for failure analysis assistance.

Markus Grützner, Christian Burmer, Christof Brillert

Microelectron. Reliab., 2010

2008

PLL soft functional failure analysis in advanced logic product using fault based analogue simulation and soft defect localization.

Liming Gao, Christian Burmer

Microelectron. Reliab., 2008

2007

Application of time resolved emission techniques within the failure analysis flow.

Peter Egger, Markus Grützner, Christian Burmer, Fabien Dudkiewicz

Microelectron. Reliab., 2007

2006

ATPG scan logic failure analysis: a case study of logic ICs - fault isolation, defect mechanism identification and yield improvement.

Liming Gao, Christian Burmer, Frank Siegelin

Microelectron. Reliab., 2006

Failure analyses for debug and ramp-up of modern IC's.

Christian Burmer, Siegfried Görlich

Microelectron. Reliab., 2006