Chun-An Shih

Orcid: 0009-0004-5546-5427

According to our database1, Chun-An Shih authored at least 1 paper in 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2025
Asymmetric Reliability and Universality of Defect Formation in Oxide-Gated Ultra-Thin In2O3Vertical FETs for Monolithic 3-D Integration.
Proceedings of the IEEE International Reliability Physics Symposium, 2025


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