David C. T. Or

According to our database, David C. T. Or authored at least 1 paper in 2003.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2003

Enhanced reliability for low-temperature gate dielectric of MOS devices by N₂O or NO plasma nitridation.

David C. T. Or, Pui-To Lai, Johnny K. O. Sin, Paul C. K. Kwok, Jing-Ping Xu

Microelectron. Reliab., 2003