David R. Akeson

According to our database, David R. Akeson authored at least 2 papers in 1998.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

1998

A highly testable and diagnosable fabrication process test chip.

Dilip K. Bhavsar, Ugonna Echeruo, David R. Akeson, William J. Bowhill

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Testability access of the high speed test features in the Alpha 21264 microprocessor.

Dilip K. Bhavsar, David R. Akeson, Michael K. Gowan, Daniel B. Jackson

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998