Dongmin Lee
Affiliations:- Hanyang University, Department of Electronic Engineering, Seoul, Korea
According to our database1,
Dongmin Lee authored at least 2 papers
between 2022 and 2023.
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Bibliography
2023
A 325F<sup>2</sup> Physical Unclonable Function Based on Contact Failure Probability With Bit Error Rate < 0.43 ppm After Preselection With 0.0177% Discard Ratio.
IEEE J. Solid State Circuits, 2023
2022
Contact PUF: Highly Stable Physical Unclonable Functions Based on Contact Failure Probability in 180 nm, 130 nm, and 28 nm CMOS Processes.
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2022