E. Kofi Vida-Torku

According to our database, E. Kofi Vida-Torku authored at least 8 papers between 1982 and 1998.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

1998

Designing for scan test of high performance embedded memories.

E. Kofi Vida-Torku, George Joos

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1995

Design and test of the PowerPC 603 microprocessor.

E. Kofi Vida-Torku, Charles H. Malley, Sung Park, R. Reed

Proceedings of the 1995 European Design and Test Conference, 1995

1994

Balancing Structured and Ad-hoc Design for Test: Testing of the PowerPC 603^TM Microprocessor.

Craig Hunter, E. Kofi Vida-Torku, Johnny J. LeBlanc

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1992

Impact of Boundary Scan Design on Delay Test.

E. Kofi Vida-Torku

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1986

Performance Assurance of Memories Embedded in VLSI Chips.

E. Kofi Vida-Torku, James A. Monzel, Charles E. Radke

Proceedings of the Proceedings International Test Conference 1986, 1986

1983

Quality level and fault coverage for multichip modules.

E. Kofi Vida-Torku, Charles E. Radke

Proceedings of the 20th Design Automation Conference, 1983

Petri Net based search directing heuristics for test generation.

E. Kofi Vida-Torku, Beverly Messick Huey

Proceedings of the 20th Design Automation Conference, 1983

1982

Do Stuck Fault Models Reflect Manufacturing Defects?

C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku

Proceedings of the Proceedings International Test Conference 1982, 1982