Edward I. Cole Jr.

According to our database, Edward I. Cole Jr. authored at least 6 papers between 1997 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2020

At-Speed Defect Localization by Combining Laser Scanning Microscopy and Power Spectrum Analysis.

Mary A. Miller, Edward I. Cole, Garth M. Kraus, Perry J. Robertson

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2016

Electronic forensic techniques for manufacturer attribution.

Ryan L. Helinski, Edward I. Cole, Gideon Robertson, Jonathan Woodbridge, Lyndon G. Pierson

Proceedings of the 2016 IEEE International Symposium on Hardware Oriented Security and Trust, 2016

2008

Non-destructive IC defect localization using optical beam-based imaging.

Edward I. Cole Jr.

Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, 2008

2004

Global Failure Localization: We Have To, But on What and How?

Edward I. Cole Jr.

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2001

Global fault localization using induced voltage alteration.

Edward I. Cole Jr.

Microelectron. Reliab., 2001

1997

Transient Power Supply Voltage (V_DDT) Analysis for Detecting IC Defects.

Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997