Charles F. Hawkins

According to our database1, Charles F. Hawkins authored at least 47 papers between 1985 and 2013.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Links

On csauthors.net:

Bibliography

2013
Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths.
IEEE Des. Test, 2013

2012
Testing of Stuck-Open Faults in Nanometer Technologies.
IEEE Des. Test Comput., 2012

2010
Reliability analysis of small delay defects in vias located in signal paths.
Proceedings of the 11th Latin American Test Workshop, 2010

2009
Stuck-Open Fault Leakage and Testing in Nanometer Technologies.
Proceedings of the 27th IEEE VLSI Test Symposium, 2009

A modern look at the CMOS stuck-open fault.
Proceedings of the 10th Latin American Test Workshop, 2009

2006
Parametric Failures and Detection Strategies.
Proceedings of the 7th Latin American Test Workshop, 2006

2005
The anatomy of nanometer timing failures.
Proceedings of the 10th European Test Symposium, 2005

2003
Multiple-parameter CMOS IC testing with increased sensitivity for I<sub>DDQ</sub>.
IEEE Trans. Very Large Scale Integr. Syst., 2003

Burn-in Temperature Projections for Deep Sub-micron Technologies.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to Detect.
Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003

CMOS IC nanometer technology failure mechanisms.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2003

2002
Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits.
IEEE Des. Test Comput., 2002

Parametric Failures in CMOS ICs - A Defect-Based Analysis.
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

GHz Testing and Its Fuzzy Targets.
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs.
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001
Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments.
Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

2000
Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions.
IEEE Trans. Very Large Scale Integr. Syst., 2000

Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ.
Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999
Test and Reliability: Partners in IC Manufacturing, Part 2.
IEEE Des. Test Comput., 1999

Deep Submicron CMOS Current IC Testing: Is There a Future?
IEEE Des. Test Comput., 1999

Test and Reliability: Partners in IC Manufacturing, Part 1.
IEEE Des. Test Comput., 1999

Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's.
Proceedings of the 1999 International Symposium on Low Power Electronics and Design, 1999

1998
CMOS IC reliability indicators and burn-in economics.
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997
Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs.
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Transient Power Supply Voltage (V<sub>DDT</sub>) Analysis for Detecting IC Defects.
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996
A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors.
J. Electron. Test., 1996

IDDQ Testing: Issues Present and Future.
IEEE Des. Test Comput., 1996

1995
IDDQ Design and Test Advantages Propel Industry.
IEEE Des. Test Comput., 1995

A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level.
Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1994
Defect Classes - An Overdue Paradigm for CMOS IC.
Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1993
The Economics of Guardband Placement.
Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

A General Purpose I<sub>DDQ</sub> Measurement Circuit.
Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

Quality Testing Requires Quality Thinking.
Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1992
IDDQ testing: A review.
J. Electron. Test., 1992

Introduction.
J. Electron. Test., 1992

Testing Errors: Data and Calculations in an IC Manufacturing Process.
Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

Economic Impact of Type I Test Errors at System and Board Levels.
Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

System Testing: The Future for All of Us.
Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1991
The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits.
Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

EE Curriculum - Continuous Process Improvement?
Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1990
Errors in testing.
Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

Zero defects or zero stuck-at faults-CMOS IC process improvement with I<sub>DDQ</sub>.
Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

Increased CMOS IC stuck-at fault coverage with reduced I <sub>DDQ</sub> test sets.
Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1989
CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations.
Proceedings of the Proceedings International Test Conference 1989, 1989

1986
Test Considerations for Gate Oxide Shorts in CMOS ICs.
IEEE Des. Test, 1986

Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs.
Proceedings of the Proceedings International Test Conference 1986, 1986

1985
Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs.
Proceedings of the Proceedings International Test Conference 1985, 1985


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