Emilian David

Orcid: 0009-0004-8200-2479

According to our database1, Emilian David authored at least 11 papers between 2019 and 2026.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

On csauthors.net:

Bibliography

2026
Ambient Parametric Test Reduction in Post-Silicon Production Testing via Temperature-Dependent Modelling: Three Approaches and a Case Study.
Proceedings of the 29th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2026

2024
On Multivariate Electrical Performance Machine Learning Driven Pre-Silicon IC Adaptive Verification.
IEEE Access, 2024

Frontend-Backend Integrated Circuit Device Linking Using Machine Learning Algorithms.
Proceedings of the 20th International Conference on Synthesis, 2024

Multiple Output Modelling of Integrated Circuits Behavior Using an Active Learning Approach.
Proceedings of the 20th International Conference on Synthesis, 2024

On Approaching Multivariate IC Pre-silicon Verification Using ML-based Adaptive Algorithms.
Proceedings of the 30th IEEE International Symposium on On-Line Testing and Robust System Design, 2024

2022
Modeling the Dependency of Analog Circuit Performance Parameters on Manufacturing Process Variations With Applications in Sensitivity Analysis and Yield Prediction.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

2020
Machine Learning-Based Local Sensitivity Analysis of Integrated Circuits to Process Variations.
Proceedings of the 27th IEEE International Conference on Electronics, Circuits and Systems, 2020

A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification.
Proceedings of the IEEE European Test Symposium, 2020

On the Pole-Placement Technique for the Design of a DC-DC Buck Converter Discrete PID Control.
Proceedings of the 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2020

2019
Modeling the Dependencies between Circuit and Technology Parameters for Sensitivity Analysis using Machine Learning Techniques.
Proceedings of the 16th International Conference on Synthesis, 2019

Pre-Silicon Yield Estimation using Machine Learning Regression.
Proceedings of the 26th IEEE International Conference on Electronics, Circuits and Systems, 2019


  Loading...